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Product Infomation | |
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Catalog Number | ASS-809 |
Product Name | Microscopy Reference Standard 809 |
Description | Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Mounted on JEOL 3/8" (9.5 mm) round mounts x 9.5 mm high |