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Product Infomation | |
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Catalog Number | ASS-807 |
Product Name | Microscopy Reference Standard 807 |
Description | Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Unmounted or unmounted on 12 mm steel disks |