Glow Discharge Mass Spectrometry (GDMS) is an extremely sensitive and powerful analytical tool used for monitoring the elemental composition and impurities in materials down to trace and ultra-trace levels. It is a high-resolution mass spectrometry technique based on a glow discharge atomization/ionization source coupled with a sector-field mass analyzer. In addition to comprehensive elemental coverage, when measurements are made in a planar sampling geometry, the depth-specific distribution of elements can be assessed with very high sensitivity.
Unknown or undesired impurities in materials often cause "annoying" interferences for material scientists or engineers. Therefore, high-purity materials are usually preferred to eliminate negative defects that could impact performance, reliability, longevity, and safety. On the other hand, intentionally adding specific impurities to materials can introduce energy levels that were previously unassessable by electronic, photonic, phononic, atomic, and molecular evaluations, thus creating great opportunities for customizing phenomena to discover new properties. Glow Discharge Mass Spectrometry (GDMS) is a powerful tool for impurity analysis.
Comprehensive survey analysis of advanced materials (metals, alloys, graphite, electronic materials, oxides, ceramics, alloy steels)
Purity certification up to 99.99999% (7N)
Measurement of trace and ultra-trace level distribution at specific depths
Tracing unknown substances in limited sample quantities
Chemical characterization of particulate materials and engineered coatings
High-Purity Metals: Copper, Gold, Titanium, Manganese
First-Generation Semiconductors: Silicon (single-crystal silicon, polycrystalline silicon, etc.), Germanium, etc.
Third-Generation Semiconductors: Gallium Nitride, Silicon Carbide, Zinc Oxide
High-Purity Carbon Materials: Diamond, Graphite, Carbon-Carbon Materials, Carbon Felt
Non-Conductors: Quartz, Yttrium Oxide, Aluminum Oxide, Zirconium Oxide, etc.
Purity Testing
Coating Material Purity Testing
Impurity Element Testing
Analysis of Unknown Impurity Elements in High-Purity Inorganic Materials
Depth Profiling of Materials
Comprehensive Survey: Covers all stable isotopes except H.
Sensitivity: Up to parts per billion (ppb) levels.
Minimal Matrix Effects
Linear Calibration
Robustness
High Sensitivity for Depth-Specific Distribution Measurement of Analytes
Detected Signal: Mass-resolved positive ions.
Covered Elements: All stable isotopes of elements, excluding H.
Sensitivity: At parts per billion (ppb) or ppb weight (ppbw) levels.
Typical Sampling Area: 50-80 mm²
Matexcel provides a one-stop service for GDMS. We are committed to becoming your competent partner in scientific and technological research. If you have any questions, feel free to contact us.